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Thesis

On the Modeling and Classification of Wafer Map Failure Patterns

Karen A. Huyser, Ph.D. E.E.

Stanford University, March 2005

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Title

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Table of Contents
56 KB
27 KB

Preface and Abstract 45 KB
23 KB

Acknowledgements
26 KB
18 KB
1
Introduction
248 KB
1900 KB
10
Conclusions and Future Work
70 KB
36 KB

Bibliography
58 KB
30 KB

Please contact me at  huyser@umich.edu  if you would like to know more about my dissertation.

I am preparing to publish chapters as refereed papers and would welcome opportunities to collaborate in future research.